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![]() Wafer processing of cantilver-based SNOM probes Cantilever-based NSOM/SNOM probes
![]() ![]() Combined AFM/SNOM image of a human chromosome (image: AG Hartmann, University of Saarbrücken) AFM/SNOM: human Chromosome We produce cantilever-based probes for near-field scanning optical microscopy (NSOM, also known as SNOM) with customized aperture size. The solid silicon tip of AFM cantilevers is replaced by a hollow pyramid with an aperture size which can be adapted to meet application specific demands. The most commonly used sizes are 50 nm and 100 nm. Compared to fiber-based NSOM probes, the cantilever-based probes show much higher light transmission, up to a factor of 100 and puts the user in a position to probe the topography of surfaces with a resolution comparable to standard AFM. ![]() ![]() Our cantilever-based silicon probes utilizes a hollow, aluminum-coated, pyramidal tip with a small aperture at the apex to focus the SNOM beam. Aluminium-coated tip For sales inquiries please contact the distristribution partner below who is responsible for your country. ![]() |
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Schaefer Group ![]() |
A.P.E. Research Mr. Suresh Babu |